Near-Perfect Infrared Transmission Based on Metallic Hole and Disk Coupling Array for Mid-Infrared Refractive Index Sensing

IF 3.7 3区工程技术 Q2 CHEMISTRY, ANALYTICAL

Chemosensors Pub Date : 2023-12-26 DOI:10.3390/chemosensors12010003

Lingyi Xu, Jianjun Lai, Qinghua Meng, Changhong Chen, Yihua Gao

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Abstract

Nanostructured color filters, particularly those generated by the extraordinary optical transmission (EOT) resonance of metal–dielectric nanostructures, have been intensively studied over the past few decades. In this work, we propose a hybrid array composed of a hole array and a disk array with the same working period within the 3–14 μm mid-infrared band. Through numerical simulations, near-perfect transmission (more than 99%) and a narrower linewidth at some resonance wavelengths were achieved, which is vital for highly sensitive sensing applications. This superior performance is attributed to the surface plasmon coupling resonance between the hole and disk arrays. A high tunability of the near-perfect transmission peak with varying structural parameters, characteristics of sensitivity to the background refractive index, and angle independence were observed. We expect that this metallic hole and disk coupling array is promising for use in various applications, such as in plasmon biosensors for the high-sensitivity detection of biochemical substances.

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基于金属孔和盘耦合阵列的近完美红外传输，用于中红外折射率传感

过去几十年来，人们一直在深入研究纳米结构滤色器，特别是由金属-电介质纳米结构的非凡光传输（EOT）共振产生的滤色器。在这项工作中，我们提出了一种由孔阵列和圆盘阵列组成的混合阵列，在 3-14 μm 中红外波段内具有相同的工作周期。通过数值模拟，该阵列实现了近乎完美的传输（超过 99%），并在某些共振波长上实现了更窄的线宽，这对于高灵敏度传感应用至关重要。这种优异的性能归功于孔阵列和盘阵列之间的表面等离子体耦合共振。我们还观察到，随着结构参数的变化，近乎完美的传输峰值具有很高的可调性，对背景折射率非常敏感，而且与角度无关。我们预计，这种金属孔和盘耦合阵列有望应用于各种领域，例如用于高灵敏度检测生化物质的等离子体生物传感器。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Chemosensors Chemistry-Analytical Chemistry

CiteScore

5.00

自引率

9.50%

发文量

450

审稿时长

11 weeks

期刊介绍： Chemosensors (ISSN 2227-9040; CODEN: CHEMO9) is an international, scientific, open access journal on the science and technology of chemical sensors published quarterly online by MDPI.The journal is indexed in Scopus, SCIE (Web of Science), CAPlus / SciFinder, Inspec, Engineering Village and other databases.