Study of Wheat Grain Structure by Digital Radiography

R. Y. Antonov
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Abstract

Introduction. Analysis of the quality of wheat grain using instrumental methods is an important task due to the permanent growth in annual wheat production and export. Digital radiography is a promising method for studying the internal structure of wheat grain. Along with other methods, digital radiography allows non-destructive testing and comprehensive description of grain parameters.Aim. To determine the capabilities of digital radiography for studying the structure of wheat grain.Materials and methods. Digital X-ray images were obtained using a multifunctional mobile x-ray diagnostic unit produced by JSC "ELTECH-Med" was used with the installation tube voltage of 9 kV. Durum wheat grain samples of different varieties were used. Operations for processing grain images were automated using the scripts developed in Python using the numpy and opencv libraries.Results. The attenuation of X-ray radiation by grain material was studied. Wheat bran was found to exhibit a greater attenuation coefficient than the endosperm, assumably due to the higher concentration of potassium and phosphorus in the wheat outer layer. The calculated ratio of the attenuation coefficients of the bran to the endosperm was 1.27, compared to the experimentally obtained value of 1.36. The influence of the geometric shape of wheat grain on the formation of its X-ray image was determined. A method for describing the geometric shape of wheat grain using second-order curves was presented. A mathematical model for the transmission of X-ray radiation in wheat grain was constructed, taking into account its complex shape and the heterogeneous distribution of macroelements therein. This model allows estimation of the attenuation coefficients of the grain endosperm and outer layer using a non-destructive method.Conclusion. Digital radiography is an effective method for studying wheat when carrying out research and breeding tasks. The proposed model for the transmission of X-ray radiation in wheat grain can be used to numerically determine some indicators of grain quality.
通过数字射线照相术研究小麦籽粒结构
引言由于每年小麦产量和出口量的持续增长,使用仪器方法分析小麦谷粒质量是一项重要任务。数字射线照相术是研究小麦籽粒内部结构的一种有前途的方法。与其他方法相比,数字射线照相术可进行无损检测并全面描述谷物参数。确定数字射线照相术研究小麦谷粒结构的能力。使用 "ELTECH-Med "股份公司生产的多功能移动式 X 射线诊断装置获取数字 X 射线图像,装置管电压为 9 kV。使用了不同品种的硬质小麦谷物样本。处理谷物图像的操作是通过使用 numpy 和 opencvr 库在 Python 中开发的脚本自动完成的。研究了谷物材料对 X 射线辐射的衰减。发现小麦麸皮的衰减系数大于胚乳,这可能是由于小麦外层的钾和磷浓度较高。计算得出的麦麸与胚乳的衰减系数之比为 1.27,而实验得出的数值为 1.36。确定了麦粒几何形状对其 X 射线图像形成的影响。提出了一种利用二阶曲线描述麦粒几何形状的方法。考虑到麦粒的复杂形状和其中大元素的异质分布,构建了 X 射线辐射在麦粒中传输的数学模型。该模型允许使用非破坏性方法估算谷物胚乳和外层的衰减系数。在开展研究和育种任务时,数字射线摄影是研究小麦的有效方法。所提出的 X 射线辐射在小麦谷粒中的传输模型可用于数值确定谷粒质量的某些指标。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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