Analysis of cultural heritage reference materials by portable and energy dispersive X-ray fluorescence measuring methods: results reliability assessment

IF 0.6 0 ARCHAEOLOGY
Audronė Bliujienė, Šarūnas Jatautis, S. Suzdalev, Gediminas Petrauskas
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引用次数: 0

Abstract

This article discusses the results of a large-scale analysis of five cultural heritage alloy reference materials (CHARM) and their shavings using handheld (pXRF) and stationary energy dispersive (ED-XRF) spectrometers. The primary objective of these studies was to assess the capability of the pXRF and ED-XRF spectrometers as a non-invasive surface-measuring technique used for the analysis of the reference materials and the reliability of the data obtained. The second objective was to evaluate the capability of the pXRF and ED-XRF spectrometers used for the analysis of shavings of the same five reference materials and to assess the data obtained. These objectives required finding the best fitting analytical tools for the comparison, and the assessment of the reliability of the data, and, very importantly, finding reliable models for data analysis and results validity verification. Based on the analysis carried out on the cultural heritage alloy reference materials, it can be concluded that the results of XRF spectrometry obtained from both spectrometers are reliable and can be compared to each other by making reference to four basic conditions: that the provided analysis should be based on certified reference materials of known elemental composition; that analysis be performed according to appropriate measuring methodology (research protocol); that analysing tools (predictive analytics) be clearly defined; and, finally, that testing be done on archaeological artefacts. The reliability and inter-correlation of the results obtained were assessed to determine the possibility of successfully applying XRF spectrometry in the investigation of archaeological artefacts produced from copper alloys.
用便携式和能量色散 X 射线荧光测量方法分析文化遗产参考材料:结果可靠性评估
本文讨论了使用手持式(pXRF)和固定式能量色散(ED-XRF)光谱仪对五种文化遗产合金标准物质(CHARM)及其刨花进行大规模分析的结果。这些研究的主要目的是评估 pXRF 和 ED-XRF 光谱仪作为用于分析参考材料的非侵入式表面测量技术的能力以及所获数据的可靠性。第二个目标是评估 pXRF 和 ED-XRF 光谱仪用于分析同样五种参考材料刨花的能力,并评估所获得的数据。这些目标要求找到最合适的分析工具进行比较,评估数据的可靠性,更重要的是找到可靠的模型进行数据分析和结果有效性验证。根据对文化遗产合金参考材料进行的分析,可以得出结论,两种光谱仪获得的 XRF 光谱分析结果都是可靠的,可以参照以下四个基本条件进行比较:提供的分析应基于已知元素组成的认证参考材料;根据适当的测量方法(研究规程)进行分析;明确定义分析工具(预测分析);最后,在考古文物上进行测试。对所获结果的可靠性和相互关联性进行了评估,以确定是否有可能成功地将 XRF 光谱法应用于铜合金考古文物的调查。
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CiteScore
1.10
自引率
75.00%
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