Asymmetric calibration method on a back-to-back double-loop differential magnetic field probe

IF 1.4 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Iet Science Measurement & Technology Pub Date : 2023-12-13 DOI:10.1049/smt2.12172

Xiao He, Lijuan Huang, Dezhi Zeng, Bo Hou, Yuan Chi, En Li

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Abstract

The asymmetric calibration method is a very interesting technology for differential output probes. It has been proven that the asymmetric calibration method (ACM) can broaden the application scenarios of the electromagnetic field dual probe. However, ACM is not verified on a back-to-back double-loop differential magnetic field probing system. This paper calibrates a back-to-back double-loop differential magnetic field probing system by inserting a connector for creating an asymmetry using ACM. The calibration results show that ACM can be used to calibrate an asymmetric back-to-back double-loop differential magnetic field probing system. The calibration results are further verified by measuring the standing wave magnetic field, and the verification results show that the asymmetric calibration method is effective in eliminating the asymmetry of the back-to-back double-loop differential magnetic field probing system and the work frequency band reaches up to 12 GHz.

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背靠背双环差分磁场探头的非对称校准方法

非对称校准法是一种非常有趣的差分输出探头技术。事实证明，非对称校准法（ACM）可以拓宽电磁场双探头的应用范围。然而，ACM 并未在背靠背双回路差分磁场探测系统上得到验证。本文使用 ACM 校准了背靠背双回路差分磁场探测系统，通过插入连接器来制造不对称。校准结果表明，ACM 可用于校准不对称背靠背双回路差分磁场探测系统。通过测量驻波磁场进一步验证了校准结果，验证结果表明非对称校准方法能有效消除背靠背双回路差分磁场探测系统的不对称，工作频带可达 12 GHz。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Iet Science Measurement & Technology 工程技术-工程：电子与电气

CiteScore

4.30

自引率

7.10%

发文量

审稿时长

7.5 months

期刊介绍： IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation.The emphasis of the journal is on theory, simulation methodologies and measurement techniques. The major themes of the journal are: - electromagnetism including electromagnetic theory, computational electromagnetics and EMC - properties and applications of dielectric, magnetic, magneto-optic, piezoelectric materials down to the nanometre scale - measurement and instrumentation including sensors, actuators, medical instrumentation, fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration Applications are welcome for illustrative purposes but the novelty and originality should focus on the proposed new methods.