Fully polarized detection of mid-infrared broadband achromatic metalenses

Xingwei Liu, Guoguo Kang, Lingxue Wang
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Abstract

Infrared polarization technology is generally applied in object detection and analysis. However, chromatic aberration restricted the development of Infrared polarization detectors. Metalenses are two-dimensional artificial electromagnetic materials to balance chromatic aberration and an ideal platform for miniaturization and integration of infrared polarization technology. In this paper, a fully polarized detection of mid-infrared achromatic metalens is designed, with a single metalens unit diameter of 30μm, a focal length of 15μm, and a working wavelength of 3μm-5μm. Through FDTD software simulation, the results show that the metalens focuses at focal plane for any polarized state light throughout the working wavelength band, with a full width at half maximum (FWHM) of the peak of less than 6&μm, achieving achromaticity. The maximum aspect ratio of the nanopillar is 15:1, meeting the requirements of electron beam lithography processing. The designed metalens achieves full-polarization detection a wider working wavelength band comparing with existing polarization detection devices, which indicates a potential application value for mid-infrared polarization detection and imaging technology.
全偏振探测中红外宽带消色差金属透镜
红外偏振技术通常应用于物体探测和分析。然而,色差限制了红外偏振探测器的发展。金属透镜是平衡色差的二维人工电磁材料,是红外偏振技术微型化和集成化的理想平台。本文设计了一种全偏振探测的中红外消色差金属膜,单个金属膜单位直径为 30μm,焦距为 15μm,工作波长为 3μm-5μm。通过 FDTD 软件仿真,结果表明,在整个工作波长带,金属膜对任何偏振态光都能在焦平面聚焦,峰值的半最大全宽(FWHM)小于 6&μm,实现了全色性。纳米柱的最大长宽比为 15:1,符合电子束光刻加工的要求。与现有的偏振探测装置相比,所设计的金属膜实现了更宽工作波段的全偏振探测,这表明它在中红外偏振探测和成像技术方面具有潜在的应用价值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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