{"title":"Zastosowania testów aplikacyjnych wraz z przykładem – SPZ z użyciem detekcji łuku wtórnego","authors":"B. Gajdemski","doi":"10.15199/74.2023.12.6","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":356591,"journal":{"name":"WIADOMOŚCI ELEKTROTECHNICZNE","volume":"46 7","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"WIADOMOŚCI ELEKTROTECHNICZNE","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15199/74.2023.12.6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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