Optimization of visible photoluminescence emission from Ni-Zn ferrite thin films

Abstract

Ni-Zn ferrite films with different thicknesses were prepared by the spray method, aiming to study the relationship between the annealing effect in an oxygen rich environment and the structural, optical properties and photoluminescence emission. X-ray diffraction (XRD) analysis used with Rietveld refinement showed that all prepared samples had a single spinel phase structure. Likewise, the Fourier transform infrared (FTIR) spectra confirmed the phase formation of Ni-Zn ferrites by appearing in both of the two characteristic absorption bands which are related to the tetrahedral and octahedral sites. For annealed thin film samples of Ni-Zn ferrite, the atomic force microscope (AFM) surface morphology exhibits pinning structure on the surface in nanoscale height, whereas for un-annealed samples, there are hills and valleys cover a broad region. The different electronic transitions were estimated from the UV-visible transmission spectrum. Strong photoluminescence (PL) intensity in the visible range was observed under the excitation of UV radiation. The intensity of the PL signal was strongest at a film thickness of 750 nm then decreased for higher thicknesses. This could be interpreted by using proposed energy level structures based on the transmission spectrum of the investigated samples. The strong PL intensity introduces the samples as a direct optical detector for UV radiation.