Quentin Gontier, Charles Wiame, Joe Wiart, François Horlin, Christo Tsigros, Claude Oestges, Philippe De Doncker
{"title":"On the Uplink and Downlink EMF Exposure and Coverage in Dense Cellular Networks: A Stochastic Geometry Approach","authors":"Quentin Gontier, Charles Wiame, Joe Wiart, François Horlin, Christo Tsigros, Claude Oestges, Philippe De Doncker","doi":"arxiv-2312.08978","DOIUrl":null,"url":null,"abstract":"Existing studies analyzing electromagnetic field (EMF) exposure in wireless\nnetworks have primarily considered downlink (DL) communications. In the uplink\n(UL), the EMF exposure caused by the user's smartphone is usually the only\nconsidered source of radiation, thereby ignoring contributions caused by other\nactive neighboring devices. In addition, the network coverage and EMF exposure\nare typically analyzed independently for both the UL and DL, while a joint\nanalysis would be necessary to fully understand the network performance. This\npaper aims at bridging the resulting gaps by presenting a comprehensive\nstochastic geometry framework including the above aspects. The proposed\ntopology features base stations (BS) modeled via a homogeneous Poisson point\nprocess as well as a user process of type II (with users uniformly distributed\nin the Voronoi cell of each BS). In addition to the UL to DL exposure ratio, we\nderive joint probability metrics considering the UL and DL coverage and EMF\nexposure. These metrics are evaluated in two scenarios considering BS and/or\nuser densifications. Our numerical results highlight the existence of optimal\nnode densities maximizing these joint probabilities.","PeriodicalId":501433,"journal":{"name":"arXiv - CS - Information Theory","volume":"17 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - CS - Information Theory","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2312.08978","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Existing studies analyzing electromagnetic field (EMF) exposure in wireless
networks have primarily considered downlink (DL) communications. In the uplink
(UL), the EMF exposure caused by the user's smartphone is usually the only
considered source of radiation, thereby ignoring contributions caused by other
active neighboring devices. In addition, the network coverage and EMF exposure
are typically analyzed independently for both the UL and DL, while a joint
analysis would be necessary to fully understand the network performance. This
paper aims at bridging the resulting gaps by presenting a comprehensive
stochastic geometry framework including the above aspects. The proposed
topology features base stations (BS) modeled via a homogeneous Poisson point
process as well as a user process of type II (with users uniformly distributed
in the Voronoi cell of each BS). In addition to the UL to DL exposure ratio, we
derive joint probability metrics considering the UL and DL coverage and EMF
exposure. These metrics are evaluated in two scenarios considering BS and/or
user densifications. Our numerical results highlight the existence of optimal
node densities maximizing these joint probabilities.