Magnetic and Electrical Properties of Electrodeposited Nickel Films

IF 1.2 Q3 MULTIDISCIPLINARY SCIENCES
M. Sultan
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引用次数: 0

Abstract

Magnetic and electrical properties of nickel (Ni) thin films produced by the electrodeposition technique under a range of growth times (30, 40, and 60 s) are investigated thoroughly using Magneto-Optical Kerr Effect (MOKE) magnetometry and Magneto-Resistance setup, respectively. To deeply understand these properties, the elemental composition, surface morphology, and bulk crystalline structure are analyzed using energy dispersive X-ray spectroscopy (EDS) with high-resolution scanning electronmicroscopy (HRSEM), grazing incidence X-ra y reflectivity(GIXR), and X-ray diffraction measurements, respectively. EDSanalysis confirms that these samples are free from impurities andcontamination. An increase in coercive fields (~67 Oe) with widedistribution (58–85 Oe) across the film area and a slight variationin the shape of the loops are noticed by decreasing the film growthtime (30 s). This is attributed to the deviations in the film surfacemorphology (defects), as confirmed by HRSEM and GIXRmeasurements. The angular dependence of the coercivity is nearlyconstant for each sample and most angles, indicating the similarityin the reversal behavior in such films.The sample resistance is foundto be ~20.3 Ω and ~2.8 Ω for films with growth times of 40 s and 60 s,respectively. The co ercivity of the AMR profiles and MOKE loops isconsistent with each other, indicating that the magnetization at thesurface performs similarly to that of their bulks. This article givesan indication that Ni films produced by this technique under suchconditions are soft at longer deposition times and largely isotropic,which is more preferable in some magnetic applications.
电沉积镍薄膜的磁性和电性
利用磁光克尔效应(MOKE)磁强计和磁阻仪分别研究了电沉积技术制备的镍薄膜在生长时间(30,40和60 s)范围内的磁性和电学性能。为了深入了解这些性质,分别使用高分辨率扫描电子显微镜(HRSEM)的能量色散x射线能谱(EDS)、掠射x射线反射率(GIXR)和x射线衍射测量分析了元素组成、表面形貌和体晶结构。eds分析确认这些样品没有杂质和污染。通过减少薄膜生长时间(30秒),可以注意到在薄膜区域广泛分布(58-85欧)的矫顽力场(~67欧)的增加和环路形状的轻微变化。这是由于薄膜表面形貌(缺陷)的偏差,HRSEM和gixr测量证实了这一点。对于每个样品和大多数角度,矫顽力的角依赖性几乎是恒定的,表明这两种薄膜的反转行为相似。当膜生长时间为40 s和60 s时,样品电阻分别为~20.3 Ω和~2.8 Ω。AMR曲线和MOKE环的矫顽力相互一致,表明表面的磁化性能与它们的体积相似。这篇文章指出,在这种条件下,用这种技术生产的Ni薄膜在较长的沉积时间内是柔软的,并且在很大程度上是各向同性的,这在一些磁性应用中更可取。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
ARO-THE SCIENTIFIC JOURNAL OF KOYA UNIVERSITY
ARO-THE SCIENTIFIC JOURNAL OF KOYA UNIVERSITY MULTIDISCIPLINARY SCIENCES-
自引率
33.30%
发文量
33
审稿时长
16 weeks
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