Electron-hole collision-limited resistance of gapped graphene

Arseny Gribachov, Vladimir Vyurkov, Dmitry Svintsov
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Abstract

Collisions between electrons and holes can dominate the carrier scattering in clean graphene samples in the vicinity of charge neutrality point. While electron-hole limited resistance in pristine gapless graphene is well-studied, its evolution with induction of band gap $E_g$ is less explored. Here, we derive the functional dependence of electron-hole limited resistance of gapped graphene $\rho_{eh}$ on the ratio of gap and thermal energy $E_g/kT$. At low temperatures and large band gaps, the resistance grows linearly with $E_g/kT$, and possesses a minimum at $E_g \approx 2.5 kT$. This contrast to the Arrhenius activation-type behaviour for intrinsic semiconductors. Introduction of impurities restores the Arrhenius law for resistivity at low temperatures and/or high doping densities. The hallmark of electron-hole collision effects in graphene resistivity at charge neutrality is the crossover between exponential and power-law resistivity scalings with temperature.
间隙石墨烯的电子-空穴碰撞限制电阻
在电荷中性点附近,电子和空穴之间的碰撞会主导石墨烯样品的载流子散射。虽然原始无间隙石墨烯中的电子-空穴有限电阻已被充分研究,但其随诱导带隙 $E_g$ 的演化却较少被探索。在此,我们研究了带隙石墨烯的电子-空穴有限电阻 $\rho_{eh}$ 与带隙和热能 $E_g/kT$ 之比之间的函数关系。在低温和大带隙条件下,电阻随 E_g/kT$ 线性增长,并在 E_g \约 2.5 kT$ 时达到最小值。这与本征半导体的阿伦尼乌斯活化型行为形成鲜明对比。在低温和/或高掺杂密度下,引入杂质会恢复电阻率的阿伦尼乌斯定律。在电荷中性时,石墨烯电阻率中电子-空穴碰撞效应的特征是电阻率随温度变化的指数和幂律缩放之间的交叉。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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