Differential magnetic field probe calibration based on symmetric de-embedding technology

IF 1.4 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Bo Hou, Shan Xue, Rui Ding, Xinxin Tian, Weiheng Shao
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Abstract

The de-embedding calibration method has been proposed to achieve high-precision calibration for a single port electric field or magnetic field probe, which can effectively eliminate the calibration ripple. However, the method's effectiveness for a four-port calibration system has not been verified yet. In this paper, a four-port de-embedding calibration method with a differential magnetic field probe is proposed, and its effectiveness is proved. Two symmetric grounded coplanar waveguide transmission lines are applied in the proposed method to solve the ABCD-matrix of the embedded part of the calibrator. The de-embedded S-parameter model of the four-port calibration system for differential magnetic field probe can be obtained. The calibration results indicate that the proposed method can also reduce the calibration ripple and compensate for the attenuation caused by the calibrator. Compared with the traditional calibration method using a microstrip line calibrator, the ripples of the proposed method can be reduced by 34%. The analysis results of the frequency interval of the ripple (FIR) in different methods show that the de-embedding method can reduce the FIRs (except around 1.2 GHz) caused by the reflection of the calibrator and retain the FIR (about 1.2 GHz) caused by the reflection of the probe itself.

Abstract Image

基于对称去嵌入技术的差分磁场探头校准
有人提出了去嵌入校准方法,以实现单端口电场或磁场探头的高精度校准,从而有效消除校准纹波。然而,该方法在四端口校准系统中的有效性尚未得到验证。本文提出了一种使用差分磁场探头的四端口去嵌入校准方法,并证明了其有效性。该方法采用两条对称接地共面波导传输线来求解校准器嵌入部分的 ABCD 矩阵。从而得到差分磁场探头四端口校准系统的去嵌入式 S 参数模型。校准结果表明,所提出的方法还能降低校准纹波并补偿校准器引起的衰减。与使用微带线校准器的传统校准方法相比,拟议方法的纹波可减少 34%。对不同方法的纹波频率间隔(FIR)的分析结果表明,去嵌入方法可以减少由校准器反射引起的 FIR(1.2 GHz 左右除外),保留由探头本身反射引起的 FIR(1.2 GHz 左右)。
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来源期刊
Iet Science Measurement & Technology
Iet Science Measurement & Technology 工程技术-工程:电子与电气
CiteScore
4.30
自引率
7.10%
发文量
41
审稿时长
7.5 months
期刊介绍: IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation.The emphasis of the journal is on theory, simulation methodologies and measurement techniques. The major themes of the journal are: - electromagnetism including electromagnetic theory, computational electromagnetics and EMC - properties and applications of dielectric, magnetic, magneto-optic, piezoelectric materials down to the nanometre scale - measurement and instrumentation including sensors, actuators, medical instrumentation, fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration Applications are welcome for illustrative purposes but the novelty and originality should focus on the proposed new methods.
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