Sascha Eichstädt, Maximilian Gruber, Anupam Prasad Vedurmudi
{"title":"Integrating metrological principles into the Internet of Things: a digital maturity model for sensor network metrology","authors":"Sascha Eichstädt, Maximilian Gruber, Anupam Prasad Vedurmudi","doi":"10.1515/teme-2023-0103","DOIUrl":null,"url":null,"abstract":"Abstract The development and integration of metrological processes to address complex, large-scale systems of interconnected measuring instruments, i.e., sensor networks, has been a topic of increasing importance in the last decade. Initial developments in sensor network metrology include, e.g., metrological treatment of sensors with digital-only output, measurement uncertainty evaluation for time series data, and the digital representation of metrological information of such sensors. In principle, modern digital technologies allow for a fully automated operation of even rather complex sensor networks. However, the integration of metrological principles to provide confidence in the measurement results in such networks is still at its beginning. In this contribution we consider a recently published structured approach to assess digital maturity based on the level of machine-readability and machine-actionability. We apply this approach to sensor networks, define the different levels of digital maturity, and discuss potential steps for further evolving the integration of metrological principles for the Internet of Things (IoT).","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":"0 1","pages":"0"},"PeriodicalIF":0.8000,"publicationDate":"2023-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Tm-Technisches Messen","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/teme-2023-0103","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
Abstract The development and integration of metrological processes to address complex, large-scale systems of interconnected measuring instruments, i.e., sensor networks, has been a topic of increasing importance in the last decade. Initial developments in sensor network metrology include, e.g., metrological treatment of sensors with digital-only output, measurement uncertainty evaluation for time series data, and the digital representation of metrological information of such sensors. In principle, modern digital technologies allow for a fully automated operation of even rather complex sensor networks. However, the integration of metrological principles to provide confidence in the measurement results in such networks is still at its beginning. In this contribution we consider a recently published structured approach to assess digital maturity based on the level of machine-readability and machine-actionability. We apply this approach to sensor networks, define the different levels of digital maturity, and discuss potential steps for further evolving the integration of metrological principles for the Internet of Things (IoT).
期刊介绍:
The journal promotes dialogue between the developers of application-oriented sensors, measurement systems, and measurement methods and the manufacturers and measurement technologists who use them.
Topics
The manufacture and characteristics of new sensors for measurement technology in the industrial sector
New measurement methods
Hardware and software based processing and analysis of measurement signals to obtain measurement values
The outcomes of employing new measurement systems and methods.