Imperfect Debugging based Generalized Exponential Testing Effort Estimation for Software Fault Detection and Removal

IF 0.9 4区工程技术 Q4 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

Journal of Circuits Systems and Computers Pub Date : 2023-10-16 DOI:10.1142/s021812662450110x

Asheesh Tiwari, Ashish Sharma

{"title":"Imperfect Debugging based Generalized Exponential Testing Effort Estimation for Software Fault Detection and Removal","authors":"Asheesh Tiwari, Ashish Sharma","doi":"10.1142/s021812662450110x","DOIUrl":null,"url":null,"abstract":"In the current technological era, the reliability growth model depicts the failure in software that is employed for estimating the reliability of software. Conventional software reliability growth model (SRGMs) usually presume that faults in software are immediately corrected once a software fault is found and no new faults are introduced. This consideration can be impractical. However, introduction of several new faults is possible throughout debugging, which is called imperfect debugging. During such a process of debugging and introduction of new faults, consumption of testing effort also plays an important role. Hence, in this paper, two models are proposed that incorporate testing effort along with imperfect debugging during fault correction. Additionally, the combined testing effort is the addition of two efforts, specifically detection effort as well as correction effort. The formulated models are validated for real data set and contrasted with additional famous SRGMs. These inferences indicate that Model 2 performs best in terms of fitting and prediction capability.","PeriodicalId":54866,"journal":{"name":"Journal of Circuits Systems and Computers","volume":"74 1","pages":"0"},"PeriodicalIF":0.9000,"publicationDate":"2023-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Circuits Systems and Computers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1142/s021812662450110x","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}

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Abstract

In the current technological era, the reliability growth model depicts the failure in software that is employed for estimating the reliability of software. Conventional software reliability growth model (SRGMs) usually presume that faults in software are immediately corrected once a software fault is found and no new faults are introduced. This consideration can be impractical. However, introduction of several new faults is possible throughout debugging, which is called imperfect debugging. During such a process of debugging and introduction of new faults, consumption of testing effort also plays an important role. Hence, in this paper, two models are proposed that incorporate testing effort along with imperfect debugging during fault correction. Additionally, the combined testing effort is the addition of two efforts, specifically detection effort as well as correction effort. The formulated models are validated for real data set and contrasted with additional famous SRGMs. These inferences indicate that Model 2 performs best in terms of fitting and prediction capability.

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基于广义指数测试工作量估计的不完全调试软件故障检测与排除

在当今的技术时代，可靠性增长模型描述了软件中的故障，用于评估软件的可靠性。传统的软件可靠性增长模型(SRGMs)通常假设一旦发现软件故障就立即纠正软件故障，并且不引入新的故障。这种考虑可能不切实际。但是，在整个调试过程中可能会引入一些新的故障，称为不完全调试。在调试和引入新故障的过程中，测试工作的消耗也起着重要的作用。因此，本文提出了两种模型，将测试工作与故障纠正过程中的不完全调试结合起来。此外，组合测试工作是两个工作的附加，特别是检测工作和纠正工作。在实际数据集上对所建立的模型进行了验证，并与其他著名的srgm模型进行了对比。这些推论表明，模型2在拟合和预测能力方面表现最好。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Journal of Circuits Systems and Computers 工程技术-工程：电子与电气

CiteScore

2.80

自引率

26.70%

发文量

350

审稿时长

5.4 months

期刊介绍： Journal of Circuits, Systems, and Computers covers a wide scope, ranging from mathematical foundations to practical engineering design in the general areas of circuits, systems, and computers with focus on their circuit aspects. Although primary emphasis will be on research papers, survey, expository and tutorial papers are also welcome. The journal consists of two sections: Papers - Contributions in this section may be of a research or tutorial nature. Research papers must be original and must not duplicate descriptions or derivations available elsewhere. The author should limit paper length whenever this can be done without impairing quality. Letters - This section provides a vehicle for speedy publication of new results and information of current interest in circuits, systems, and computers. Focus will be directed to practical design- and applications-oriented contributions, but publication in this section will not be restricted to this material. These letters are to concentrate on reporting the results obtained, their significance and the conclusions, while including only the minimum of supporting details required to understand the contribution. Publication of a manuscript in this manner does not preclude a later publication with a fully developed version.