角度分解光電子分光によるBi(111)上Sb超薄膜の電子状態

H. ABE, M. IMAMURA, K. TAKAHASHI, A. TAKAYAMA
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Abstract

To investigate electronic states at the interface between surfaces that exhibit unique spin-split band dispersions is an important step in the development of a new materials that can be used to spintronics device. Antimony (Sb) and bismuth (Bi) are interesting targets for studying the nature of peculiar spin properties due to spin-orbit interactions. In this study, we fabricated the Sb ultrathin films on Bi substrate. The surface structure and electronic states of Sb/Bi heterostructure was confirmed by the low-energy electron diffraction measurement and angle-resolved photoemission spectroscopy, respectively. For 2 and 3 BL Sb film on Bi substrate, we observed a “V”-shaped electronic band, which is significantly different from the electronic state of Bi thin film and freestanding Sb ultrathin film. We conclude that this band dispersion is caused by the tensile lattice strain of Sb ultrathin film and the hybridization effect of the wavefunction with the Bi substrate.
由于角度分解光电子能谱的Bi(111)上的Sb超薄电子状态
研究具有独特自旋分裂带色散的表面之间界面的电子态是开发可用于自旋电子学器件的新材料的重要一步。锑(Sb)和铋(Bi)是研究自旋轨道相互作用引起的特殊自旋性质的有趣对象。在本研究中,我们在Bi衬底上制备了Sb超薄膜。通过低能电子衍射测量和角分辨光谱学分别确定了Sb/Bi异质结构的表面结构和电子态。对于Bi衬底上的2和3 BL Sb薄膜,我们观察到一个“V”形的电子带,这与Bi薄膜和独立式Sb超薄膜的电子态有明显的不同。我们认为这种频散是由Sb超薄膜的拉伸晶格应变和波函数与Bi衬底的杂化效应引起的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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