A data-driven distributed process monitoring method for industry manufacturing systems

IF 1.7 4区 计算机科学 Q3 AUTOMATION & CONTROL SYSTEMS
Ming Yin, Jiayi Tian, Dan Zhu, Yibo Wang, Jijiao Jiang
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引用次数: 0

Abstract

Process monitoring technology can help make the right decisions in manufacturing, but the complexity and scale of modern process industry processes render process monitoring difficult. Existing data-driven process monitoring methods utilize abundant monitoring data that are accumulated in industrial processes, but nonlinearity, high coupling, noise effects, and other problems continuously appear in process industry monitoring data. This study proposes a process monitoring method based on variational autoencoder and long short-term memory techniques. The method reconstructs the monitoring data by learning their distribution and time series characteristics under the controlled state, and then it monitors the state of the manufacturing process in real time by calculating the statistics. Evaluation is conducted using the Tennessee Eastman process case verification and experimental comparison method. Then, the proposed method is compared with the centralized process via principal component analysis and kernel principal component analysis. The results show that the proposed method can more significantly improve the effect of fault detection in distributed system process monitoring compared with the traditional method, and it has a better process monitoring effect.
面向工业制造系统的数据驱动分布式过程监控方法
过程监控技术可以帮助在制造过程中做出正确的决策,但现代过程工业过程的复杂性和规模使得过程监控变得困难。现有的数据驱动过程监测方法利用了工业过程中积累的大量监测数据,但过程工业监测数据中不断出现非线性、高耦合、噪声效应等问题。本研究提出一种基于变分自编码器和长短期记忆技术的过程监控方法。该方法通过学习监控数据在受控状态下的分布和时间序列特征,对监控数据进行重构,然后通过统计量的计算对制造过程的状态进行实时监控。采用田纳西伊士曼工艺案例验证和实验对比的方法进行评价。然后,通过主成分分析和核主成分分析,将该方法与集中式过程进行比较。结果表明,与传统方法相比,所提出的方法能更显著地提高分布式系统过程监控中的故障检测效果,具有更好的过程监控效果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
4.10
自引率
16.70%
发文量
203
审稿时长
3.4 months
期刊介绍: Transactions of the Institute of Measurement and Control is a fully peer-reviewed international journal. The journal covers all areas of applications in instrumentation and control. Its scope encompasses cutting-edge research and development, education and industrial applications.
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