An investigation into the impacts of deep learning‐based re‐sampling on specific emitter identification performance

Mohamed K. M. Fadul, Donald R. Reising, Lakmali P. Weerasena
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Abstract

Abstract Increasing Internet of Things (IoT) deployments present a growing surface over which villainous actors can carry out attacks. This disturbing revelation is amplified by the fact that most IoT devices use weak or no encryption. Specific Emitter Identification (SEI) is an approach intended to address this IoT security weakness. This work provides the first Deep Learning (DL) driven SEI approach that upsamples the signals after collection to improve performance while reducing the hardware requirements of the IoT devices that collect them. DL‐driven upsampling results in superior SEI performance versus two traditional upsampling approaches and a convolutional neural network‐only approach.
研究基于深度学习的重采样对特定发射器识别性能的影响
越来越多的物联网(IoT)部署为恶意行为者进行攻击提供了越来越多的空间。大多数物联网设备使用弱加密或没有加密,这一事实放大了这一令人不安的启示。特定发射器识别(SEI)是一种旨在解决物联网安全弱点的方法。这项工作提供了第一个深度学习(DL)驱动的SEI方法,该方法在收集信号后对信号进行采样,以提高性能,同时降低收集信号的物联网设备的硬件要求。与两种传统的上采样方法和仅卷积神经网络方法相比,DL驱动的上采样结果具有优越的SEI性能。
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