Interfacial excess of solutes across phase boundaries using atom probe microscopy

IF 2.1 3区 工程技术 Q2 MICROSCOPY
F. Theska, S. Primig
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引用次数: 0

Abstract

Three-dimensional elemental mapping in atom probe microscopy provides invaluable insights into the structure and composition of interfaces in materials. Quasi-atomic resolution facilitates access to the solute decoration of grain boundaries, advancing the knowledge on local segregation and depletion phenomena. More recent developments unlocked three-dimensional mapping of the interfacial excess across grain boundaries. Such detailed understanding of the local structure and composition of these interfaces enabled advancements in processing methods and material development. However, many engineering alloys, such as Ni-based superalloys, have much more complex microstructures with various solutes and precipitates in close proximity to grain boundaries. The complex interaction of grain boundary segregation and grain boundary precipitates requires precise compositional control. However, abrupt changes in solute solubility across phase boundaries obscure the interfacial excess in proximity to grain boundaries.

Therefore, this study provides a methodological framework of the quantitative characterization of phase boundaries in proximity to grain boundaries using atom probe microscopy. The detailed mass spectrum ranging of MC, M23C6, and M6C carbides is explored in order to achieve satisfactory compositional information. Proximity histograms and correlating concentration difference profiles determine the interface location, where a Gibbs dividing surface is not accessible. This enables reliable direct calculation of the interfacial excess across phase boundaries. Intuitively interpretable and quantitative ‘interface plots’ are introduced, and showcased for phase boundaries between γ-matrix, γ' precipitates, GB-γ', MC, M23C6, and M6C carbides. The presented framework advances access to the local composition in proximity to grain boundaries and may be applicable to other engineering alloys or materials with functional properties.

Abstract Image

用原子探针显微镜观察溶质越过相界的界面过量
原子探针显微镜中的三维元素映射为材料界面的结构和组成提供了宝贵的见解。准原子分辨率有助于研究晶界的溶质修饰,促进对局部偏析和耗竭现象的认识。最近的发展揭示了跨晶界界面过剩的三维映射。对这些界面的局部结构和组成的详细了解使加工方法和材料开发取得了进步。然而,许多工程合金,如镍基高温合金,具有更复杂的显微组织,在靠近晶界的地方有各种溶质和析出物。晶界偏析和晶界沉淀的复杂相互作用需要精确的成分控制。然而,溶质溶解度在相界上的突然变化掩盖了晶界附近的界面过剩。因此,本研究提供了一个使用原子探针显微镜对晶界附近相界进行定量表征的方法学框架。探讨了MC、M23C6和M6C碳化物的详细质谱范围,以获得满意的成分信息。邻近直方图和相关的浓度差曲线确定了界面位置,其中吉布斯划分面是不可接近的。这样可以可靠地直接计算跨相界的界面过剩。引入了直观的可解释和定量的“界面图”,并展示了γ-基体,γ'沉淀,GB-γ', MC, M23C6和M6C碳化物之间的相界。所提出的框架促进了接近晶界的局部成分的获取,并可适用于其他具有功能特性的工程合金或材料。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
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