An Optimal Parameter Extraction Procedure for SiC Power MOSFET Model

Q4 Engineering
Hicham Er-rafii, Abdelghafour Galadi
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引用次数: 0

Abstract

A simple and efficient parameter extraction method for Silicon Carbide (SiC) power MOSFET model is described. This method uses nonlinear optimization algorithm to find the optimal set of parameters to model. The optimizer algorithm starts with initial guess parameters, extracted from measurement, to provide a set of parameters minimizing errors between model and measurements data in entire operating regions of the device. The starting initial guess parameter values give to the algorithm a closed solution to obtain the optimal set of model parameters with reduced iteratives. The Levenberg-Marquardt (LM) algorithm will be used in this work. The efficiency of the proposed extraction method is proved with the good agreements obtained between the model and the measurements.
SiC功率MOSFET模型的参数提取方法
介绍了一种简单有效的碳化硅功率MOSFET模型参数提取方法。该方法采用非线性优化算法寻找最优参数集进行建模。优化器算法从从测量中提取的初始猜测参数开始,提供一组参数,以最大限度地减少设备整个操作区域中模型和测量数据之间的误差。初始猜测参数值为算法提供了一个封闭解,以减少迭代次数获得最优模型参数集。本文将使用Levenberg-Marquardt (LM)算法。模型与实测数据吻合良好,证明了所提提取方法的有效性。
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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