{"title":"An Optimal Parameter Extraction Procedure for SiC Power MOSFET Model","authors":"Hicham Er-rafii, Abdelghafour Galadi","doi":"10.29292/jics.v18i2.756","DOIUrl":null,"url":null,"abstract":"A simple and efficient parameter extraction method for Silicon Carbide (SiC) power MOSFET model is described. This method uses nonlinear optimization algorithm to find the optimal set of parameters to model. The optimizer algorithm starts with initial guess parameters, extracted from measurement, to provide a set of parameters minimizing errors between model and measurements data in entire operating regions of the device. The starting initial guess parameter values give to the algorithm a closed solution to obtain the optimal set of model parameters with reduced iteratives. The Levenberg-Marquardt (LM) algorithm will be used in this work. The efficiency of the proposed extraction method is proved with the good agreements obtained between the model and the measurements.","PeriodicalId":39974,"journal":{"name":"Journal of Integrated Circuits and Systems","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Integrated Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.29292/jics.v18i2.756","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0
Abstract
A simple and efficient parameter extraction method for Silicon Carbide (SiC) power MOSFET model is described. This method uses nonlinear optimization algorithm to find the optimal set of parameters to model. The optimizer algorithm starts with initial guess parameters, extracted from measurement, to provide a set of parameters minimizing errors between model and measurements data in entire operating regions of the device. The starting initial guess parameter values give to the algorithm a closed solution to obtain the optimal set of model parameters with reduced iteratives. The Levenberg-Marquardt (LM) algorithm will be used in this work. The efficiency of the proposed extraction method is proved with the good agreements obtained between the model and the measurements.
期刊介绍:
This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.