{"title":"An Innovative Architecture of DRAM PUF","authors":"Abhishek Kumar, None Manoj Sindhwani, Shippu Sachdeva","doi":"10.29292/jics.v18i2.675","DOIUrl":null,"url":null,"abstract":"Cryptographic solutions based on traditional authentication methods are susceptible to several attacks on secret keys. Dynamic random access memory (DRAM)-based physical unclonable functions (PUF) are described as promising security building blocks to enable cryptography and authentication services. PUFs frequently suffer reliability concerns since they are sensitive to both internal and exterior noises. The need for enhanced resistance and dependability results in significant additional overheads. In this work, we proposed a DRAM-PUF based on the inclusion of selective hardware features in the computation. The proposed solution offers a higher number of challenge-response pairs (CRP) without additional circuitry. An innovative structure of PUF is presented in the paper which offers a reliable challenge-response pair module for authentication and authorization based on the ubiquitous nature of memory without the need for an additional circuit. DRAM PUF utilized the random startup value initialized by a capacitor followed by a random number generator. Our proposed PUF shows a reliability of 99.46% with temperature variation, a reliability of 99.5% with supply voltage variation, a uniqueness of 49.46%, a bit aliasing of 46.875%, and a uniformity of 47.65%.","PeriodicalId":39974,"journal":{"name":"Journal of Integrated Circuits and Systems","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Integrated Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.29292/jics.v18i2.675","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0
Abstract
Cryptographic solutions based on traditional authentication methods are susceptible to several attacks on secret keys. Dynamic random access memory (DRAM)-based physical unclonable functions (PUF) are described as promising security building blocks to enable cryptography and authentication services. PUFs frequently suffer reliability concerns since they are sensitive to both internal and exterior noises. The need for enhanced resistance and dependability results in significant additional overheads. In this work, we proposed a DRAM-PUF based on the inclusion of selective hardware features in the computation. The proposed solution offers a higher number of challenge-response pairs (CRP) without additional circuitry. An innovative structure of PUF is presented in the paper which offers a reliable challenge-response pair module for authentication and authorization based on the ubiquitous nature of memory without the need for an additional circuit. DRAM PUF utilized the random startup value initialized by a capacitor followed by a random number generator. Our proposed PUF shows a reliability of 99.46% with temperature variation, a reliability of 99.5% with supply voltage variation, a uniqueness of 49.46%, a bit aliasing of 46.875%, and a uniformity of 47.65%.
期刊介绍:
This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.