An Innovative Architecture of DRAM PUF

Q4 Engineering
Abhishek Kumar, None Manoj Sindhwani, Shippu Sachdeva
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引用次数: 0

Abstract

Cryptographic solutions based on traditional authentication methods are susceptible to several attacks on secret keys. Dynamic random access memory (DRAM)-based physical unclonable functions (PUF) are described as promising security building blocks to enable cryptography and authentication services. PUFs frequently suffer reliability concerns since they are sensitive to both internal and exterior noises. The need for enhanced resistance and dependability results in significant additional overheads. In this work, we proposed a DRAM-PUF based on the inclusion of selective hardware features in the computation. The proposed solution offers a higher number of challenge-response pairs (CRP) without additional circuitry. An innovative structure of PUF is presented in the paper which offers a reliable challenge-response pair module for authentication and authorization based on the ubiquitous nature of memory without the need for an additional circuit. DRAM PUF utilized the random startup value initialized by a capacitor followed by a random number generator. Our proposed PUF shows a reliability of 99.46% with temperature variation, a reliability of 99.5% with supply voltage variation, a uniqueness of 49.46%, a bit aliasing of 46.875%, and a uniformity of 47.65%.
一种创新的DRAM PUF架构
基于传统身份验证方法的加密解决方案容易受到几种针对密钥的攻击。基于动态随机存取存储器(DRAM)的物理不可克隆功能(PUF)被描述为支持加密和身份验证服务的有前途的安全构建块。由于puf对内部和外部噪声都很敏感,因此经常受到可靠性问题的困扰。对增强抵抗力和可靠性的需求导致了大量的额外开销。在这项工作中,我们提出了一种基于在计算中包含选择性硬件特征的DRAM-PUF。提出的解决方案提供了更高数量的挑战响应对(CRP),而无需额外的电路。本文提出了一种新颖的PUF结构,该结构基于存储器的普遍性,在不需要额外电路的情况下,为认证和授权提供了可靠的质询-响应对模块。DRAM PUF利用由电容器初始化的随机启动值,随后是随机数生成器。该PUF在温度变化时的可靠性为99.46%,在电源电压变化时的可靠性为99.5%,唯一性为49.46%,位混迭率为46.875%,均匀性为47.65%。
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来源期刊
Journal of Integrated Circuits and Systems
Journal of Integrated Circuits and Systems Engineering-Electrical and Electronic Engineering
CiteScore
0.90
自引率
0.00%
发文量
39
期刊介绍: This journal will present state-of-art papers on Integrated Circuits and Systems. It is an effort of both Brazilian Microelectronics Society - SBMicro and Brazilian Computer Society - SBC to create a new scientific journal covering Process and Materials, Device and Characterization, Design, Test and CAD of Integrated Circuits and Systems. The Journal of Integrated Circuits and Systems is published through Special Issues on subjects to be defined by the Editorial Board. Special issues will publish selected papers from both Brazilian Societies annual conferences, SBCCI - Symposium on Integrated Circuits and Systems and SBMicro - Symposium on Microelectronics Technology and Devices.
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