A Cross-Line Structured Light Scanning System Based on a Measuring Arm

Abstract

The measurement system proposed in this paper, using a measuring arm and line structured light, has a wide range of applications. To improve the scanning efficiency, the system outlined in this paper uses two single-line structured lights to form crosshair structured light, which we combine with a measuring arm to form a comprehensive scanning measurement system. The calibration method of Zhengyou Zhang and a calibration board are used to complete parameter calibration of the sensors and cameras, as well as hand–eye calibration of the measuring arm. For complex curved-surface objects, this system extracts the cross-line structured light optical center location, which suffers from ambiguity. Therefore, we introduce the use of periodic control of the two line structured light sources in order to resolve the light extraction polysemy. Our experimental results indicate that the proposed system can effectively satisfy the function of crosshair structured light scanning of large, complex surfaces.