Principle and research progress of four-quadrant detector spot detection
Q4 Physics and Astronomy
引用次数: 0
Abstract
光斑检测技术在现代科学研究与应用中扮演着重要角色，四象限探测器由于其具有探测灵敏度高、信号处理简单和抗干扰能力强等优点，在光斑检测技术中得到了广泛的应用，是捕获、跟踪和瞄准系统中的关键器件。首先介绍了光斑检测中常用的光斑模型和四象限探测器检测光斑原理，然后分析了国内外在四象限探测器检测光斑方面的研究成果，以及影响四象限探测器检测光斑精度的因素和常用的光斑检测算法，同时介绍了四象限探测器的光斑检测系统,包括光束对准检测系统、四象限探测器跟踪通信复合系统和微纳激光通信系统。最后，展望了光斑检测技术的发展前景。四象限探测器斑点检测原理及研究进展
光斑检测技术在现代科学研究与应用中扮演着重要角色，四象限探测器由于其具有探测灵敏度高、信号处理简单和抗干扰能力强等优点，在光斑检测技术中得到了广泛的应用，是捕获、跟踪和瞄准系统中的关键器件。首先介绍了光斑检测中常用的光斑模型和四象限探测器检测光斑原理，然后分析了国内外在四象限探测器检测光斑方面的研究成果，以及影响四象限探测器检测光斑精度的因素和常用的光斑检测算法，同时介绍了四象限探测器的光斑检测系统,包括光束对准检测系统、四象限探测器跟踪通信复合系统和微纳激光通信系统。最后，展望了光斑检测技术的发展前景。
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来源期刊
光学应用
Physics and Astronomy-Atomic and Molecular Physics, and Optics
CiteScore
1.00
自引率
0.00%
发文量
5894
期刊介绍：
Journal of Applied Optics was founded in 1980, and its domestic and international publication numbers are ISSN 1002-2082 and CN-61-1171/O4. The journal is a technical journal sponsored by the China Ordnance Society and the 205th Institute of China Ordnance Industry. It was included in the "China Science and Technology Core Journal" in April 2006 and in the "Chinese Core Journal" in December 2008. It is included in the journals of important international retrieval institutions such as the American Chemical Abstracts (CA), Cambridge Scientific Abstracts (CSA), Russian Abstracts Journal (AJ), British Scientific Abstracts (INSPEC), Ulrich's Periodical Directory (UIPD), and Polish Index Copernicus (IC). The purpose of the journal is to track the research trends of high-tech at home and abroad, and comprehensively reflect the development status, research level, and application of optoelectronic technology at home and abroad; focus on optoelectronic application technology, advocate scientific research, be close to readers, and be close to enterprises, and focus on reporting new theories, new technologies and new methods, new products, and development trends in the field of optoelectronic technology at home and abroad. This journal solicits research papers on engineering optics, optical information acquisition and processing, optical metrology and detection, low-light-level night vision technology, fiber optic sensing technology, infrared application technology, laser application technology, optoelectronic devices, thin film optics, optical processes and equipment, and displays.
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