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Non-contact automated defect detection usingdeep learning approach in diffraction phasemicroscopy

IF 1.1 Q4 OPTICS
Optics continuum Pub Date : 2023-11-07 DOI:10.1364/optcon.506150
DHRUVAM PANDEY, abhinav saini, G Rajshekhar
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基于深度学习方法的衍射相显微镜非接触式自动缺陷检测
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Optics continuum
Optics continuum
CiteScore
3.50
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