Experimental and theoretical study of parallel models for thermoelectric properties of double-layer thermoelectric thin films

None Yang Shi-Guan, None 孙志刚, None Lin Xin, None He Jun-Song, None Zhai Li-Jun, None Cheng Lin, None Lv Ming Hao, None Liu Hong-Xia, None Sun Zhi-Gang
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Abstract

Currently, the measurement and prediction of the electrical transport performance of thermoelectric double-layer membranes is often based on the theory of parallel modelling, however, the conditions for the use of parallel modelling lack theoretical and experimental support and validation. In this paper, the Seebeck coefficients of Cu/Si and Ag/Si bilayers under applied temperature difference are obtained by using finite element theory simulations with the help of COMSOL Multiphysics software and compared with the parallel model. The effects of whether the ends of the bilayer are plated with a metal Pt layer or not, and the insertion of a high-resistance/low-resistance/insulation interface between the bilayers on the Seebeck coefficient measurements of the bilayer are investigated. It is found that when there is no Pt at the hot and cold ends, the potentials on the Si and Cu sides at the high-resistance and electrically insulating interfaces are uniformly distributed along the direction of the temperature gradient, respectively, and the measured Seebeck coefficients are the same as the value of the material itself, respectively, and the thermal potentials on the Cu side at the low-resistance interfaces vary uniformly with the probe spacing L, while the Si side shows a non-uniform variation. With Pt, the thermal potentials on the Cu and Si sides are uniformly distributed along the direction of the temperature gradient, and the measured values on both Si and Cu sides are the same as the Cu Seebeck coefficients, regardless of the insulating/high-resistance/low-resistance interface. Si/Ag and Bi/Ag bilayers were experimentally investigated. In the absence of Pt, the absolute value of the Seebeck coefficient on the Si side of Si/Ag bilayers decreased with decreasing temperature, but the absolute value of the Seebeck coefficient on the Ag side increased with decreasing temperature. In the presence of Pt, the Seebeck coefficients are the same on both sides of the Bi/Ag bilayer membrane.
双层热电薄膜热电特性平行模型的实验与理论研究
目前,热电双层膜电输运性能的测量和预测往往基于并行建模理论,然而,使用并行建模的条件缺乏理论和实验的支持和验证。本文利用COMSOL Multiphysics软件对Cu/Si和Ag/Si双层材料在外加温差下的塞贝克系数进行了有限元理论模拟,并与并行模型进行了比较。研究了双层膜两端是否镀金属Pt层、双层膜之间是否插入高阻/低阻/绝缘界面对双层膜塞贝克系数测量的影响。结果发现,当冷热端不存在Pt时,高阻和电绝缘界面处Si侧和Cu侧的电势分别沿温度梯度方向均匀分布,测得的塞贝克系数分别与材料本身的值相同,低阻界面处Cu侧的热势随探针间距L均匀变化。而Si侧则表现出不均匀的变化。Pt时,无论绝缘/高阻/低阻界面如何,Cu侧和Si侧的热势沿温度梯度方向均匀分布,且Si侧和Cu侧的测量值与Cu的Seebeck系数相同。实验研究了Si/Ag和Bi/Ag双分子层。在Pt不存在的情况下,Si/Ag双分子层Si侧的Seebeck系数绝对值随温度的降低而减小,而Ag侧的Seebeck系数绝对值随温度的降低而增大。Pt存在时,Bi/Ag双膜两侧的塞贝克系数相同。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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