Physical and Optical Properties of Cuo Doped in Soda Lime Silicate Glasses Produced from Waste Glass Cullet

IF 0.7 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
N. Mahingsa, N. Siristtipokakun, J. Kaewkhao, K. Kirdsiri
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Abstract

AbstractFor this article, waste glass cullet obtained from the glass industry was used as a choice of SiO2 substitute in glass manufacturing. A series of soda lime silicate glasses doped with CuO, in composition (55−x) SiO2: 15Li2O: 20Na2O: 10CaO: xCuO (x = 0.00, 0.01, 0.02, 0.03, 0.04, and 0.05 mol%)) were prepared by melt-quenching technique. The parameters such as density and molar volume were measured and evaluated their oscillator strength, refractive index, ion concentration, polaron radius, and inter-nuclear distance. Optical properties such as refractive index, absorption spectra, optical band gab, and CIE L*a*b* were investigated. With increasing of CuO concentration, the density and the refractive index of glasses increased, while the molar volume decreased. The absorption spectra show board peak in the range of 550 to 950 nm. The addition of CuO generated the blue hue in glasses, corresponding to the CIE L*a*b color coordinate.Keywords: Waste glassculletsoda lime silicateglassCuO AcknowledgmentsThe research team would like to thank the Nakhon Pathom Rajabhat University Research Center of Excellence in Glass Technology and Materials Science for providing tools and equipment as well as facilitating research operations.Disclosure StatementNo potential conflict of interest was reported by the author(s).
废玻璃片制备钠钙硅酸盐玻璃中掺杂Cuo的物理光学性质
摘要本文以玻璃工业生产的废玻璃屑为原料,选用二氧化硅作为玻璃生产的替代品。采用熔淬法制备了一系列CuO掺杂钠钙硅酸盐玻璃,其组成为(55−x) SiO2: 15Li2O: 20Na2O: 10CaO: xCuO (x = 0.00, 0.01, 0.02, 0.03, 0.04和0.05 mol%)。测量了密度和摩尔体积等参数,并评估了它们的振荡强度、折射率、离子浓度、极化子半径和核间距离。研究了材料的折射率、吸收光谱、光带gab和CIE L*a*b*等光学特性。随着CuO浓度的增加,玻璃的密度和折射率增大,而摩尔体积减小。吸收光谱在550 ~ 950 nm范围内出现板峰。CuO的加入产生了玻璃中的蓝色色调,对应于cie L*a*b颜色坐标。关键词:废玻璃,钠石灰,硅,玻璃,cuo致谢研究团队要感谢那空普松拉贾哈特大学卓越玻璃技术和材料科学研究中心提供的工具和设备以及便利的研究操作。披露声明作者未报告潜在的利益冲突。
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来源期刊
Integrated Ferroelectrics
Integrated Ferroelectrics 工程技术-工程:电子与电气
CiteScore
1.40
自引率
0.00%
发文量
179
审稿时长
3 months
期刊介绍: Integrated Ferroelectrics provides an international, interdisciplinary forum for electronic engineers and physicists as well as process and systems engineers, ceramicists, and chemists who are involved in research, design, development, manufacturing and utilization of integrated ferroelectric devices. Such devices unite ferroelectric films and semiconductor integrated circuit chips. The result is a new family of electronic devices, which combine the unique nonvolatile memory, pyroelectric, piezoelectric, photorefractive, radiation-hard, acoustic and/or dielectric properties of ferroelectric materials with the dynamic memory, logic and/or amplification properties and miniaturization and low-cost advantages of semiconductor i.c. technology.
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