The Properties of Bi ₂ O ₃ Additive on Radiation Shielding and Elastic Moduli Properties of TeO ₂ –P ₂ O ₅ Based Glass System

IF 0.7 4区工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC

Integrated Ferroelectrics Pub Date : 2023-09-29 DOI:10.1080/10584587.2023.2234576

S. Ravangvong, P. Glumglomchit, S. Zuprakhon, T. Thinkoksoong, P. Jitrawang, K. Sriwongsa, C. Khobkham, J. Kaewkhao

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引用次数: 0

Abstract

AbstractThe radiation shielding and elastic moduli properties of (60–x)TeO2–30P2O5–xBi2O3 (x increased from 10–50 mol% in 10 mol% increments) glass series have been discussed. The radiation shielding quantities such as mass attenuation coefficient (µm), effective atomic numbers (Zeff), half value layer (HVL) and mean free path (MFP) were calculated using Phy–X/PSD program at energies ranging from 1 keV–100 GeV while exposure and energy absorption buildup factors (EBF and EABF) were evaluated using geometric progression (G–P) fitting method at energies ranging 0.015–15 MeV for penetration depths (PD) until 40 mean free path (mfp). In addition, the density and elastic moduli were estimated. The results found that the TPB5 glass sample having the largest content of Bi2O3 possessed the highest density and excellent radiation shielding properties. This reflected that replacing TeO2 with Bi2O3 improved effective radiation shielding. In addition, the MFP for glass series were lower than the hematite-serpentine concrete. It indicated that this glass series are photon shielding better than the hematite-serpentine concrete. Whereas, this sample had the lowest elastic moduli. These results indicated that Bi2O3, a network modifier, has broken glass network bonds and formed non–bridging oxygen (NBOs) which affects the elastic moduli of the glass system.Keywords: Radiation shieldingelastic moduliglass AcknowledgmentsThis research is financially supported by Thailand Science Research and Innovation (TSRI) National Science, Research and Innovation Fund (NSRF) (Fiscal Year 2022)Disclosure StatementNo potential conflict of interest was reported by the author(s).

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bi2o3添加剂对teo2 -P - 2o5基玻璃体系辐射屏蔽性能和弹性模量性能的影响

摘要本文讨论了(60-x) TeO2-30P2O5-xBi2O3 (x从10 - 50 mol%递增10 mol%)玻璃系列的辐射屏蔽性能和弹性模量性能。利用物理- x /PSD程序计算了在1 kv - 100 GeV能量范围内的辐射屏蔽量，如质量衰减系数(µm)、有效原子序数(Zeff)、半值层(HVL)和平均自由程(MFP)，并利用几何级数(G-P)拟合方法评估了在0.015-15 MeV能量范围内穿透深度(PD)至40平均自由程(MFP)的暴露和能量吸收累积因子(EBF和EABF)。此外，还估算了其密度和弹性模量。结果表明，Bi2O3含量最大的TPB5玻璃样品具有最高的密度和优异的辐射屏蔽性能。这反映了用Bi2O3代替TeO2提高了有效的辐射屏蔽。此外，玻璃系列的MFP低于赤铁矿-蛇纹石混凝土。结果表明，该系列玻璃的光子屏蔽性能优于赤铁矿-蛇纹石混凝土。然而，这种样品具有最低的弹性模量。这些结果表明，网络改性剂Bi2O3破坏了玻璃网络键，形成非桥氧(NBOs)，影响了玻璃体系的弹性模量。本研究由泰国科学研究与创新(TSRI)国家科学、研究与创新基金(NSRF)(2022财政年度)资助，披露声明作者未报告潜在利益冲突。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Integrated Ferroelectrics 工程技术-工程：电子与电气

CiteScore

1.40

自引率

0.00%

发文量

179

审稿时长

3 months

期刊介绍： Integrated Ferroelectrics provides an international, interdisciplinary forum for electronic engineers and physicists as well as process and systems engineers, ceramicists, and chemists who are involved in research, design, development, manufacturing and utilization of integrated ferroelectric devices. Such devices unite ferroelectric films and semiconductor integrated circuit chips. The result is a new family of electronic devices, which combine the unique nonvolatile memory, pyroelectric, piezoelectric, photorefractive, radiation-hard, acoustic and/or dielectric properties of ferroelectric materials with the dynamic memory, logic and/or amplification properties and miniaturization and low-cost advantages of semiconductor i.c. technology.