Shaping Micro-Bunched Electron Beams for Compact X-ray Free-Electron Lasers with Transverse Gradient Undulators

Q3 Physics and Astronomy
River R. Robles, James B. Rosenzweig
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引用次数: 0

Abstract

Laser-modulator-based micro-bunching of electron beams has been applied to many novel operating modes of X-ray free-electron lasers from harmonic generation to attosecond pulse production. Recently, it was also identified as a key enabling technology for the production of a compact XFEL driven by a relatively low-energy beam. In traditional laser modulator schemes with low-energy and high-current bunches, collective effects limit the possible working points that can be employed, and thus it is difficult to achieve optimal XFEL performance. We propose to utilize transverse longitudinal coupling in a transverse gradient undulator (TGU) to shape micro-bunched electron beams so as to optimize their performance in a compact X-ray free-electron laser. We show that a TGU added to a conventional laser modulator stage enables much more flexibility in the design, allowing one to generate longer micro-bunches less subject to slippage effects and even lower the slice emittance of the micro-bunches. We present a theoretical analysis of laser-based micro-bunching with an added TGU, simulation of compression with collective effects in such systems, and finally XFEL simulations demonstrating the gains in peak power enabled by the TGU. Although we focus on the application to compact XFELs, what we propose is a general phase space manipulation that may find utility in other applications as well.
具有横向梯度波动的紧凑x射线自由电子激光器的微束电子束整形
基于激光调制器的电子束微聚束已被应用于许多新的x射线自由电子激光器的工作模式,从谐波产生到阿秒脉冲产生。最近,它也被确定为生产由相对低能量光束驱动的紧凑型XFEL的关键使能技术。在传统的低能量大电流束激光调制器方案中,集体效应限制了可采用的工作点,因此难以获得最佳的XFEL性能。我们提出利用横向梯度波动器(TGU)中的横向纵向耦合来形成微束电子束,以优化其在紧凑的x射线自由电子激光器中的性能。我们的研究表明,在传统的激光调制器中添加TGU可以使设计更具灵活性,从而可以产生更长的微束,而不受滑移效应的影响,甚至可以降低微束的片发射率。我们提出了一个理论分析的激光微束与一个附加的TGU,模拟压缩与集体效应在这样的系统中,最后的XFEL模拟演示了峰值功率的增益由TGU实现。尽管我们关注的是压缩XFELs的应用程序,但我们提出的是一种通用的相位空间操作,它也可能在其他应用程序中找到实用工具。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Instruments
Instruments Physics and Astronomy-Instrumentation
CiteScore
2.60
自引率
0.00%
发文量
70
审稿时长
11 weeks
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