{"title":"Simulation of active circuit survivability","authors":"L. Wiederspahn, K. Chung, J. Canyon","doi":"10.1109/AERO.1996.495900","DOIUrl":null,"url":null,"abstract":"A new method has been developed to predict survivability thresholds of HEMT active devices under large RF drive. HEMT MMIC circuit survivability levels have been accurately determined for a 6-9 and a 9-18 GHz LNA.","PeriodicalId":262646,"journal":{"name":"1996 IEEE Aerospace Applications Conference. Proceedings","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 IEEE Aerospace Applications Conference. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AERO.1996.495900","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A new method has been developed to predict survivability thresholds of HEMT active devices under large RF drive. HEMT MMIC circuit survivability levels have been accurately determined for a 6-9 and a 9-18 GHz LNA.