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A Systematic Approach Towards Development of Universal Software Fault Prediction Model Using Object-Oriented Design Measurement

Nanoelectronics, Circuits and Communication Systems Pub Date : 2018-08-02 DOI:10.1007/978-981-13-0776-8_48
D. Kumari, K. Rajnish
{"title":"A Systematic Approach Towards Development of Universal Software Fault Prediction Model Using Object-Oriented Design Measurement","authors":"D. Kumari, K. Rajnish","doi":"10.1007/978-981-13-0776-8_48","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":156887,"journal":{"name":"Nanoelectronics, Circuits and Communication Systems","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nanoelectronics, Circuits and Communication Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-981-13-0776-8_48","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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基于面向对象设计度量的通用软件故障预测模型系统开发方法
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Nanoelectronics, Circuits and Communication Systems
Nanoelectronics, Circuits and Communication Systems
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