{"title":"A fusion prognostics method for remaining useful life prediction of electronic products","authors":"Shunfeng Cheng, M. Pecht","doi":"10.1109/COASE.2009.5234098","DOIUrl":null,"url":null,"abstract":"Prognostics and health management methods can provide advance warning of failure; reduce the life cycle cost of a product by decreasing inspection costs, downtime, and inventory; and assist in the design and logistical support of fielded and future electronic products. Traditional prognostic methods, such as data-driven methods and physics of failure methods have some limitations. This paper presents a fusion prognostics method, which fuses data-driven methods and physics of failure methods to predict the remaining useful life of electronic products. This method integrates the advantage and overcome the limitations of the data-driven methods and the physics of failure methods to provide better predictions.","PeriodicalId":386046,"journal":{"name":"2009 IEEE International Conference on Automation Science and Engineering","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"102","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE International Conference on Automation Science and Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/COASE.2009.5234098","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 102
Abstract
Prognostics and health management methods can provide advance warning of failure; reduce the life cycle cost of a product by decreasing inspection costs, downtime, and inventory; and assist in the design and logistical support of fielded and future electronic products. Traditional prognostic methods, such as data-driven methods and physics of failure methods have some limitations. This paper presents a fusion prognostics method, which fuses data-driven methods and physics of failure methods to predict the remaining useful life of electronic products. This method integrates the advantage and overcome the limitations of the data-driven methods and the physics of failure methods to provide better predictions.