V. Senthilkumaran, N. Beier, P. Shabaninezhad, J. Stinehart, S. Fourmaux, T. Richards, A. Arce-Borkent, S. Meschian, S. Knudsen, M. Lipsett, L. Zhou, J. Moore, A. Hussein
{"title":"Imaging of Defects in Additively Manufactured Alloys Using Betatron X-Rays","authors":"V. Senthilkumaran, N. Beier, P. Shabaninezhad, J. Stinehart, S. Fourmaux, T. Richards, A. Arce-Borkent, S. Meschian, S. Knudsen, M. Lipsett, L. Zhou, J. Moore, A. Hussein","doi":"10.1109/ICOPS45751.2022.9813025","DOIUrl":null,"url":null,"abstract":"Betatron radiation is a synchrotron-like X-ray emission generated from the oscillations of trapped relativistic electrons during laser wakefield acceleration (LWFA). Betatron sources are broadband keV X-rays with small source sizes and few-femtosecond pulse durations, ideal for high-resolution phase contrast and X-ray imaging of dense materials. Here, we present the characterization (spatial resolution and acquisition time) of the betatron X-rays from different gases to study their ability for high-resolution imaging of micrometer-scale defects in additively manufactured (AM) aluminium-silicon alloys. Characterization of the X-ray source spectrum, spatial resolution, source size and betatron emission length was performed using the Advanced Laser Light Source in Varennes, Canada. Upcoming applications of these sources for high-resolution, high-throughput 3D tomography of porosity evolution of AM alloys under tension will be discussed.","PeriodicalId":175964,"journal":{"name":"2022 IEEE International Conference on Plasma Science (ICOPS)","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Conference on Plasma Science (ICOPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICOPS45751.2022.9813025","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Betatron radiation is a synchrotron-like X-ray emission generated from the oscillations of trapped relativistic electrons during laser wakefield acceleration (LWFA). Betatron sources are broadband keV X-rays with small source sizes and few-femtosecond pulse durations, ideal for high-resolution phase contrast and X-ray imaging of dense materials. Here, we present the characterization (spatial resolution and acquisition time) of the betatron X-rays from different gases to study their ability for high-resolution imaging of micrometer-scale defects in additively manufactured (AM) aluminium-silicon alloys. Characterization of the X-ray source spectrum, spatial resolution, source size and betatron emission length was performed using the Advanced Laser Light Source in Varennes, Canada. Upcoming applications of these sources for high-resolution, high-throughput 3D tomography of porosity evolution of AM alloys under tension will be discussed.