A Novel Extraction Technique of Long Term Memory Effects in Solid State Amplifiers Based on Compound Dynamic Volterra Models Structure

Abstract

Accurate modelling of memory effects of RF amplifiers has becomes a prime importance in the design process for the new generations of communications systems. A tremendous amount of modeling techniques has been proposed lately. A capital point in these behavioral modeling is the ease and accuracy of model parameter extraction process along with the model run time efficiency in system level simulation tools. This paper proposes an new and effective extraction technique for dynamic Volterra series based model, as well as a model implementation technique in system level simulation.