Integrating a Boolean satisfiability checker and BDDs for combinational equivalence checking

Aarti Gupta, P. Ashar
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引用次数: 40

Abstract

There has been much interest in techniques which combine the advantages of function-based methods, such as BDDs, with structure-based methods, such as ATPG, for verifying the equivalence of combinational circuits. However, most existing efforts have focused on exploiting circuit similarity through use of learning and/or ATPG-based methods rather than on making the integration between BDDs and ATPG techniques efficient. This paper presents a new technique, where the focus is on improving the equivalence check itself, thereby making it more robust in the absence of circuit similarity. It is based on tight integration of a Boolean Satisfiability Checker with BDDs, whereby BDDs are effectively used to reduce both the problem size and the number of backtracks for the satisfiability problem. This methodology does not preclude exploitation of circuit similarity, when it exists, since the improved check can be easily incorporated as the inner loop of the well-known iterative framework involving search and replacement of internally equivalent nodes. We demonstrate the significance of our contributions with practical results on the ISCAS benchmark circuits.
组合等价性检验中布尔可满足性检验和bdd的集成
将基于功能的方法(如bdd)的优点与基于结构的方法(如ATPG)相结合,用于验证组合电路的等效性的技术引起了人们的极大兴趣。然而,大多数现有的努力都集中在通过使用学习和/或基于ATPG的方法来开发电路相似性上,而不是在bdd和ATPG技术之间进行有效的集成。本文提出了一种新技术,其重点是改进等效性检查本身,从而使其在没有电路相似性的情况下更具鲁棒性。它基于布尔可满足性检查器与bdd的紧密集成,因此bdd可以有效地用于减少可满足性问题的问题大小和回溯数量。这种方法并不排除利用电路相似性,当它存在时,因为改进的检查可以很容易地合并为众所周知的迭代框架的内环,涉及内部等效节点的搜索和替换。我们通过在ISCAS基准电路上的实际结果证明了我们的贡献的重要性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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