{"title":"Expanded research of spectroscopic optical tomographic functional imaging system","authors":"Yuheng Chen, Z. Ding, J. Meng","doi":"10.1117/12.741360","DOIUrl":null,"url":null,"abstract":"Spectroscopic optical coherence tomography (OCT), a functional extension of conventional structural OCT is developed based on previous fiber-based OCT system. Spectral information is obtained by carrying out Fourier transformation of the detected OCT signal without recurring to hardware. The developed system is applied to film reflectivity measurement and spectroscopic imaging of a finger from a human volunteer. The feasibility for spectroscopic extension of the developed system is confirmed by comparison curves of film reflectivity measured by the developed system with that obtained from a commercial spectrometer.","PeriodicalId":110373,"journal":{"name":"International Conference on Photonics and Imaging in Biology and Medicine","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Photonics and Imaging in Biology and Medicine","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.741360","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Spectroscopic optical coherence tomography (OCT), a functional extension of conventional structural OCT is developed based on previous fiber-based OCT system. Spectral information is obtained by carrying out Fourier transformation of the detected OCT signal without recurring to hardware. The developed system is applied to film reflectivity measurement and spectroscopic imaging of a finger from a human volunteer. The feasibility for spectroscopic extension of the developed system is confirmed by comparison curves of film reflectivity measured by the developed system with that obtained from a commercial spectrometer.