A. Jain, Lalit Kumar Lata, Abhinandan Jain, P. K. Jain
{"title":"Effect of SiO2 Thickness Variation on Threshold Voltage and Trans-Conductance of TFT","authors":"A. Jain, Lalit Kumar Lata, Abhinandan Jain, P. K. Jain","doi":"10.47904/ijskit.11.2.2021.37-39","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":424149,"journal":{"name":"SKIT Research Journal","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SKIT Research Journal","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.47904/ijskit.11.2.2021.37-39","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}