Mathematical Model of Piezoelectric Element Noise: Influence on Nanosensor—Actuator Quality

Abstract

The paper theoretically determines the dependence of the electrically excited noise, damped oscillations piezoelectric sensor, integrated with SWCNT (single-wall carbon nanotube) needle and charge amplifier, from defects of an SWCNT graphene sheet and sensor malfunctions generally, for AFM (atomic force microscopy) with high-resolution. Also is the proposed method for estimating the piezoelectric sensor state, integrated with the SWCNT needle and charge amplifier when evaluating “SWCNT needle-surface” contact in real-time scanning AFM. Many micro-machining techniques have been employed to fabricate signal oscillations piezoelectric sensors and piezoelectric nanoactuators. The properties of SWCNT, for example, high strength, many times greater than the strength of steel, makes them suitable elements for use as needles probe microscopy. This paper presents both experimental and analytical data to show the critical characteristics of a piezoelectric sensor, integrated with SWCNT needle contact in the real-time scanning AFM.