Setup and experimental results analysis of COTS Camera and SRAMs at the ISIS neutron facility

2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) Pub Date : 2018-04-01 DOI:10.1109/DTIS.2018.8368564

M. Ottavi, Dario Asciolla, Tiziano Fiorucci, Elena Grosso, Carla Marzullo, Alessandro Scaramella, Simone Stramaccioni, Alessia Zibecchi, C. Andreani, G. Cardarilli, C. Cazzaniga, L. Nunzio, R. Fazzolari, M. Re, P. Reviriego, G. Furano, R. Senesi

{"title":"Setup and experimental results analysis of COTS Camera and SRAMs at the ISIS neutron facility","authors":"M. Ottavi, Dario Asciolla, Tiziano Fiorucci, Elena Grosso, Carla Marzullo, Alessandro Scaramella, Simone Stramaccioni, Alessia Zibecchi, C. Andreani, G. Cardarilli, C. Cazzaniga, L. Nunzio, R. Fazzolari, M. Re, P. Reviriego, G. Furano, R. Senesi","doi":"10.1109/DTIS.2018.8368564","DOIUrl":null,"url":null,"abstract":"The study of the effects of neutrons induced errors in Commercial Off The Shelf (COTS) components is becoming increasingly important for terrestrial and avionics applications as their potential impact in terms of reliability and safety could be catastrophic. This paper describes the setup and the experimental analysis of neutron irradiation tests performed at the Rutherford Appleton Laboratories (ISIS) neutron accelerator on the NEMESYS (Neutron Effects on MEmory SYStems) platform, a project which has the goal of studying the effects of atmospheric neutrons on COTS components during the stratospheric flight of a balloon. The results of bit upsets on the COTS SRAM and COTS Camera obtained from the tests are discussed and correlated together with a discussion on the observed system Single Event Functional Interrupts (SEFIs) providing an overall characterization of the targeted COTS components as well as on the setup on NEMESYS.","PeriodicalId":328650,"journal":{"name":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","volume":"285 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DTIS.2018.8368564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 3

Abstract

The study of the effects of neutrons induced errors in Commercial Off The Shelf (COTS) components is becoming increasingly important for terrestrial and avionics applications as their potential impact in terms of reliability and safety could be catastrophic. This paper describes the setup and the experimental analysis of neutron irradiation tests performed at the Rutherford Appleton Laboratories (ISIS) neutron accelerator on the NEMESYS (Neutron Effects on MEmory SYStems) platform, a project which has the goal of studying the effects of atmospheric neutrons on COTS components during the stratospheric flight of a balloon. The results of bit upsets on the COTS SRAM and COTS Camera obtained from the tests are discussed and correlated together with a discussion on the observed system Single Event Functional Interrupts (SEFIs) providing an overall characterization of the targeted COTS components as well as on the setup on NEMESYS.

查看原文本刊更多论文

ISIS中子设施中COTS相机与sram的设置与实验结果分析

由于中子诱发误差对可靠性和安全性的潜在影响可能是灾难性的，因此研究商用现货(COTS)组件中的中子诱发误差对地面和航空电子应用的影响变得越来越重要。本文介绍了在美国卢瑟福阿普尔顿实验室(ISIS)中子加速器NEMESYS (neutron Effects on MEmory SYStems)平台上进行的中子辐照试验的设置和实验分析。NEMESYS是一个研究气球平流层飞行过程中大气中子对COTS组件影响的项目。讨论了从测试中获得的COTS SRAM和COTS相机上的位扰动结果，并将其与观察到的系统单事件功能中断(sefi)进行了讨论，从而提供了目标COTS组件的总体特征以及在NEMESYS上的设置。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)

自引率

0.00%

发文量