{"title":"Comparison of laser safe scanning patterns for second generation LiDAR deflection units","authors":"T. Fersch, R. Weigel, A. Kölpin","doi":"10.23919/IRS.2017.8008131","DOIUrl":null,"url":null,"abstract":"The calculation of the maximum permissible optical energy for two scanning patterns of miniaturized scanning LiDAR systems is presented. The scanning patterns are selected to be suitable for next generation systems based on MEMS mirrors and Optical Phased Arrays alike. Two different wavelengths are compared. Based on the current version of the laser safety standard IEC 60825-1 the maximum energy is determined for the two patterns and two wavelengths. For a wavelength of 1550 nm no differences are revealed. At 905 nm, patterns allowing a large spatial and temporal separation between subsequent measurements are favored.","PeriodicalId":430241,"journal":{"name":"2017 18th International Radar Symposium (IRS)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 18th International Radar Symposium (IRS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/IRS.2017.8008131","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The calculation of the maximum permissible optical energy for two scanning patterns of miniaturized scanning LiDAR systems is presented. The scanning patterns are selected to be suitable for next generation systems based on MEMS mirrors and Optical Phased Arrays alike. Two different wavelengths are compared. Based on the current version of the laser safety standard IEC 60825-1 the maximum energy is determined for the two patterns and two wavelengths. For a wavelength of 1550 nm no differences are revealed. At 905 nm, patterns allowing a large spatial and temporal separation between subsequent measurements are favored.