Advancements in picosecond resolution time interval measurement techniques

Abstract

New, efficient measurement techniques are used to adequately characterize the actual performance of the new generation of programmable equivalent time sequential sampling oscilloscopes. These instruments provide new time interval measurement capabilities with increased repeatability and accuracy. Subpicosecond repeatability for risetime measurements of fast step generators (20 ps transition time) has been observed. A typical timebase related peak error of 3 ps for short time interval measurements (up to tens of ns) has been shown. A brief introduction on the horizontal timebase error sources is followed by the description of the automated measurement techniques. Finally actual measurement results are shown using the described techniques.<>