Investigation of the microwave electromagnetic field attenuation effect in the discharge chamber of a resonant type plasmatron

S. Bordusau, S. Madveika, A. Dostanko
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引用次数: 1

Abstract

The investigation of the microwave energy penetration (f = 2,45 ± 0,05 GHz) in the center of the oxygen gas discharge in the resonant type plasmatron was carried out on the example of microwave plasma-chemical processing of silicon plates. The investigation was performed by three independent methods: using a thermocouple for investigating temperature characteristics of the microwave discharge; according to the data of the "active probe" which was injected into the volume of discharge chamber; using an electric probe which was placed in the volume of plasma for measuring the electrical conductivity of the space. The experimental results indicate that for the levels of microwave power flux density in the discharge volume ranging within 0.06-0.08 W/cm3 the microwave field is entered into the volume of the discharge zone. This effect must be taken into account when organizing the processes of plasma-chemical treatment (the influence of microwave field on the parameters of the processed structures, explanation of "loading effect", when chosen construction of a system for supplying microwave energy to the treatment area, in the analysis forms and character of microwave field distribution in the gas discharge area, etc.) and for analysing the results of processing of materials and semiconductor structures which may be exposed to microwave energy.
共振型等离子体放电腔内微波电磁场衰减效应的研究
以硅板的微波等离子体化学加工为例,研究了谐振型等离子体中氧气放电中心的微波能量穿透(f = 2.45±0.05 GHz)。通过三种独立的方法进行了研究:利用热电偶研究微波放电的温度特性;根据“主动探头”注入放电室容积的数据;使用放置在等离子体体积中的电探针来测量空间的电导率。实验结果表明,当放电体积内的微波功率磁通密度水平在0.06 ~ 0.08 W/cm3范围内时,微波场进入放电区的体积内。在组织等离子体化学处理过程时,必须考虑到这一影响(微波场对被处理结构参数的影响、“负荷效应”的解释、选择向处理区提供微波能量的系统结构、分析气体放电区微波场分布的形式和特征、等)和分析可能暴露于微波能量的材料和半导体结构的加工结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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