High-Performance FinFET with Dopant-Segregated Schottky Source/Drain

A. Kaneko, A. Yagishita, K. Yahashi, T. Kubota, M. Omura, K. Matsuo, I. Mizushima, K. Okano, H. Kawasaki, T. Izumida, T. Kanemura, N. Aoki, A. Kinoshita, J. Koga, S. Inaba, K. Ishimaru, Y. Toyoshima, H. Ishiuchi, K. Suguro, K. Eguchi, Y. Tsunashima
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引用次数: 53

Abstract

High-performance CMOS-FinFET with dopant-segregated Schottky source/drain (DS-Schottky S/D) technology has been demonstrated. Thanks to the low parasitic resistance in DS-Schottky S/D, high drive current of 960 muA/mum was achieved for nFET with Lg = 15 nm and Wfin =15 nm at Vd= 1.0 V and Ioff= 100 nA/mum. Furthermore, the propagation delay time has been successfully improved down to less than 5 ps in the ring oscillator with DS-Schottky S/D CMOS-FinFET with 15 nm gate length
高性能FinFET与掺杂隔离肖特基源/漏
高性能CMOS-FinFET与掺杂剂隔离肖特基源/漏极(ds -肖特基S/D)技术已被证明。由于DS-Schottky S/D的低寄生电阻,在Vd= 1.0 V, Ioff= 100 nA/mum时,Lg =15 nm, Wfin =15 nm的nFET获得了960 muA/mum的高驱动电流。此外,在15 nm栅极长度的DS-Schottky S/D CMOS-FinFET环形振荡器中,传输延迟时间已成功改善至小于5 ps
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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