{"title":"Automated Microwave Measurements in the Research Laboratory Environment","authors":"M. de la Chapelle, J. Gulick, R. Eisenhart","doi":"10.1109/ARFTG.1983.323559","DOIUrl":null,"url":null,"abstract":"This paper describes the advantages of microwave measurement automation in the research laboratory, the implementation costs, and the specific requirements of the automated test system. A discussion of the need to develop versatile software that can be applied to a variety of different experiments is also included. We present a detailed account of the general program developed to automate a microwave amplifier or oscillator experiment featuring real time displaying of all parameters on the CRT, and the ability to plot any recorded parameter as a function of another. The results of an automated experiment to measure the circuit Q of an injection locked oscillator are shown as examples.","PeriodicalId":347704,"journal":{"name":"22nd ARFTG Conference Digest","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1983-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"22nd ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1983.323559","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This paper describes the advantages of microwave measurement automation in the research laboratory, the implementation costs, and the specific requirements of the automated test system. A discussion of the need to develop versatile software that can be applied to a variety of different experiments is also included. We present a detailed account of the general program developed to automate a microwave amplifier or oscillator experiment featuring real time displaying of all parameters on the CRT, and the ability to plot any recorded parameter as a function of another. The results of an automated experiment to measure the circuit Q of an injection locked oscillator are shown as examples.