Intelligent Control Semiconductor Laser Reliability Test System

Abstract

With the development of electronic technology, semiconductor lasers have been widely used in the field of optoelectronics due to their own distinctive features. In order to improve the performance of semiconductor lasers, reliability testing research has become a hot issue at present. In this paper, the intelligent control semiconductor laser reliability test system is described. Its aging and screening process must be controlled by a highly automated, intelligent control system. There are five parts that make up this system: the master control system, the slave control system, the RS-485 serial data interface standard used to communicate between the master unit and the slave unit, the hot stage used to control the test temperature and the power supply includes +5V, +12V, ±15V, +24V. The test system is mainly controlled by AT89C51 single-chip microcomputer, which can not only realize the continuous adjustment of the drive current (0~3A), but also realize the continuous adjustment of the aging temperature (room temperature~150°C). Moreover, the system’s current control accuracy is up to milliamp, and temperature control accuracy is ±0.5°C. The system can also preset the aging current value and the aging temperature value, and display the current working current and working temperature in real time.