Localized random access scan: Towards low area and routing overhead

Yu Hu, Xiang Fu, Xiaoxin Fan, H. Fujiwara
{"title":"Localized random access scan: Towards low area and routing overhead","authors":"Yu Hu, Xiang Fu, Xiaoxin Fan, H. Fujiwara","doi":"10.1109/ASPDAC.2008.4484016","DOIUrl":null,"url":null,"abstract":"Conventional random access scan (RAS) designs, although economic in test power dissipation, test application time and test data volume, are expensive in area and routing overhead. In this paper, we present a localized RAS architecture (LRAS) to address this issue. A novel scan cell structure, which has fewer transistors than the multiplexer-type scan cell, is proposed to eliminate the global test enable signal and to localize the row enable and the column enable signals. Experimental results on ISCAS'89 and ITC'99 benchmark circuits demonstrate that LRAS has 54% less area overhead than multiplexer-type scan chain based designs, while significantly outperforms the state-of-the-art RAS scheme in routing overhead.","PeriodicalId":277556,"journal":{"name":"2008 Asia and South Pacific Design Automation Conference","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-01-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 Asia and South Pacific Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2008.4484016","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18

Abstract

Conventional random access scan (RAS) designs, although economic in test power dissipation, test application time and test data volume, are expensive in area and routing overhead. In this paper, we present a localized RAS architecture (LRAS) to address this issue. A novel scan cell structure, which has fewer transistors than the multiplexer-type scan cell, is proposed to eliminate the global test enable signal and to localize the row enable and the column enable signals. Experimental results on ISCAS'89 and ITC'99 benchmark circuits demonstrate that LRAS has 54% less area overhead than multiplexer-type scan chain based designs, while significantly outperforms the state-of-the-art RAS scheme in routing overhead.
局部随机访问扫描:面向低区域和路由开销
传统的随机存取扫描(RAS)设计虽然在测试功耗、测试应用时间和测试数据量方面具有经济性,但在面积和路由开销方面却很昂贵。在本文中,我们提出了一个本地化的RAS体系结构(LRAS)来解决这个问题。提出了一种新型扫描单元结构,该结构比复用器型扫描单元具有更少的晶体管,可以消除全局测试使能信号,并对行使能信号和列使能信号进行局部化。在ISCAS'89和ITC'99基准电路上的实验结果表明,LRAS比基于多路复用器型扫描链的设计减少了54%的面积开销,同时在路由开销方面显著优于最先进的RAS方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信