In Situ and Ex Situ Spectroscopic Ellipsometry of Electrochromic NiO Films

Optical Interference Coatings Conference (OIC) 2019 Pub Date : 2019-06-02 DOI:10.1364/OIC.2019.THC.6

L. Dubé-Riopel, B. Baloukas, O. Zabeida, L. Martinu

引用次数: 0

Abstract

In situ ellipsometric measurements during cyclic voltammetry, supported by ex situ measurements, allow for the precise and continuous characterization of the optical properties of electrochromic NiO films in their various states of coloration.

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电致变色NiO薄膜的原位和非原位光谱椭偏

循环伏安法中的原位椭偏测量，在非原位测量的支持下，可以精确和连续地表征电致变色NiO薄膜在各种颜色状态下的光学特性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Optical Interference Coatings Conference (OIC) 2019

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