Solid-State Drives Parameters Control System For Ionizing Radiation Tests

Abstract

The paper describes an automated system for monitoring the parameters of solid-state drives under the influence of ionizing radiation using National Instruments equipment and NI LabVIEW software. The paper presents a block diagram of a test bench developed based on the National Instruments hardware complex. It allows us to supply voltage to a device under test (DUT), measure the value of the DUT current consumption, and carry out functional control of solid-state drives with NAND flash memory and SATA and USB interfaces in order to register single event latch-ups (SEL) and the loss of the device's ability to read and rewrite information. The paper provides a detailed description of the functional tools included in the software that was developed using the NI LabVIEW programming environment and used for reading and subsequent analysis of data on solid-state drives, as well as for writing new data and the ability to perform various operations on them. The paper describes the main steps of the total ionizing dose testing procedure that was carried out on solid-state drives. The results of the experiment are presented.