J. Schrattenecker, Stefan Dipl.-Ing. Schuster, A. Haderer, G. Reinthaler, A. Stelzer
{"title":"Accuracy limits of a seam-tracking algorithm for microwave systems at mm-wave frequencies","authors":"J. Schrattenecker, Stefan Dipl.-Ing. Schuster, A. Haderer, G. Reinthaler, A. Stelzer","doi":"10.5281/ZENODO.43446","DOIUrl":null,"url":null,"abstract":"This paper examines a novel concept for estimating the position of a lap joint based on polarimetric scattering effects. While the principle measurement method and setup have already been presented in [1] we focus on the associated accuracy limits, i.e., the Cramér-Rao lower bound (CRLB) calculation for this approach. The minimum achievable position estimation variance is calculated for a variety of estimation scenarios. These calculations are then validated with simulations and real world measurements.","PeriodicalId":400766,"journal":{"name":"21st European Signal Processing Conference (EUSIPCO 2013)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st European Signal Processing Conference (EUSIPCO 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5281/ZENODO.43446","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper examines a novel concept for estimating the position of a lap joint based on polarimetric scattering effects. While the principle measurement method and setup have already been presented in [1] we focus on the associated accuracy limits, i.e., the Cramér-Rao lower bound (CRLB) calculation for this approach. The minimum achievable position estimation variance is calculated for a variety of estimation scenarios. These calculations are then validated with simulations and real world measurements.