Combined Inductive and Capacitive NDE Technique for Insulator-Conductor Hybrid Structures

T. Zhu, K. Wen, Chengjie Deng, X. Yin, Xiaorui Zhang, X. Yuan, Wei Li, Guoming Chen
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Abstract

This paper presents a new inductance-capacitance non-destructive detection technique with a form of planar dual-mode sensor. The detection principle of the sensor in mode-L and mode-C was analyzed, and the feasibility of this new combination of inductance and capacitance nondestructive detection technique was demonstrated. A PCB sensor was designed and manufactured, a further research on the characteristic physical field of the designed sensor using finite element simulation software was presented. A suitable detection system was developed to realize this new dual-mode detection technique using this dual-mode detection sensor. Typical test pieces were prepared and tested. The detection results show that the proposed new inductance-capacitance technique can detect typical defects in both insulator and conductor layers of the insulator-conductor hybrid structure with a good balance of inductance and capacitance performance, indicating that this new detection technique can be further used for insulator-conductor hybrid structures non-destructive testing with the potential for structure detection, quantitative evaluation, damage imaging and other applications.
绝缘体-导体混合结构的电感与电容相结合无损检测技术
本文提出了一种采用平面双模传感器形式的新型电感-电容无损检测技术。分析了传感器在l模式和c模式下的检测原理,论证了这种新型电感与电容相结合的无损检测技术的可行性。设计并制造了一种PCB传感器,利用有限元仿真软件对所设计传感器的特征物理场进行了进一步的研究。利用该双模检测传感器开发了一套适合的检测系统来实现这种新的双模检测技术。制作了典型试件并进行了试验。检测结果表明,所提出的新型电感-电容检测技术能够检测出绝缘子-导体复合结构的绝缘子层和导体层的典型缺陷,并且具有良好的电感性能和电容性能平衡,表明该检测技术可进一步用于绝缘子-导体复合结构的无损检测,具有结构检测、定量评价、损伤成像等应用潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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