T. Zhu, K. Wen, Chengjie Deng, X. Yin, Xiaorui Zhang, X. Yuan, Wei Li, Guoming Chen
{"title":"Combined Inductive and Capacitive NDE Technique for Insulator-Conductor Hybrid Structures","authors":"T. Zhu, K. Wen, Chengjie Deng, X. Yin, Xiaorui Zhang, X. Yuan, Wei Li, Guoming Chen","doi":"10.1115/qnde2021-75049","DOIUrl":null,"url":null,"abstract":"\n This paper presents a new inductance-capacitance non-destructive detection technique with a form of planar dual-mode sensor. The detection principle of the sensor in mode-L and mode-C was analyzed, and the feasibility of this new combination of inductance and capacitance nondestructive detection technique was demonstrated. A PCB sensor was designed and manufactured, a further research on the characteristic physical field of the designed sensor using finite element simulation software was presented. A suitable detection system was developed to realize this new dual-mode detection technique using this dual-mode detection sensor. Typical test pieces were prepared and tested. The detection results show that the proposed new inductance-capacitance technique can detect typical defects in both insulator and conductor layers of the insulator-conductor hybrid structure with a good balance of inductance and capacitance performance, indicating that this new detection technique can be further used for insulator-conductor hybrid structures non-destructive testing with the potential for structure detection, quantitative evaluation, damage imaging and other applications.","PeriodicalId":189764,"journal":{"name":"2021 48th Annual Review of Progress in Quantitative Nondestructive Evaluation","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 48th Annual Review of Progress in Quantitative Nondestructive Evaluation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1115/qnde2021-75049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents a new inductance-capacitance non-destructive detection technique with a form of planar dual-mode sensor. The detection principle of the sensor in mode-L and mode-C was analyzed, and the feasibility of this new combination of inductance and capacitance nondestructive detection technique was demonstrated. A PCB sensor was designed and manufactured, a further research on the characteristic physical field of the designed sensor using finite element simulation software was presented. A suitable detection system was developed to realize this new dual-mode detection technique using this dual-mode detection sensor. Typical test pieces were prepared and tested. The detection results show that the proposed new inductance-capacitance technique can detect typical defects in both insulator and conductor layers of the insulator-conductor hybrid structure with a good balance of inductance and capacitance performance, indicating that this new detection technique can be further used for insulator-conductor hybrid structures non-destructive testing with the potential for structure detection, quantitative evaluation, damage imaging and other applications.