{"title":"Analog system modeling based on a double modified complex valued neural network","authors":"A. Luchetta, S. Manetti, M. C. Piccirilli","doi":"10.1109/IJCNN.2013.6707136","DOIUrl":null,"url":null,"abstract":"The aim of this work is to present a novel technique for the identification of lumped circuit models of general distributed apparatus and devices. It is based on the use of a double modified complex value neural network. The method is not oriented to a unique class of electromagnetic systems, but it gives a procedure for the complete validation of the approximated lumped model and the extraction of the electrical parameter values. The inputs of the system are the geometrical (and/or manufacturing) parameters of the considered structure, while the outputs are the lumped circuit parameters. The method follows the Frequency Response Analysis (FRA) approach for elaborating the data presented to the network.","PeriodicalId":376975,"journal":{"name":"The 2013 International Joint Conference on Neural Networks (IJCNN)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 2013 International Joint Conference on Neural Networks (IJCNN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IJCNN.2013.6707136","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The aim of this work is to present a novel technique for the identification of lumped circuit models of general distributed apparatus and devices. It is based on the use of a double modified complex value neural network. The method is not oriented to a unique class of electromagnetic systems, but it gives a procedure for the complete validation of the approximated lumped model and the extraction of the electrical parameter values. The inputs of the system are the geometrical (and/or manufacturing) parameters of the considered structure, while the outputs are the lumped circuit parameters. The method follows the Frequency Response Analysis (FRA) approach for elaborating the data presented to the network.