{"title":"Optimized Test Case Generation Based on Operational Profiles with Fault-Proneness Information","authors":"Tomohiko Takagi, Mutlu Beyazit","doi":"10.1007/978-3-319-11265-7_2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":347448,"journal":{"name":"Software Engineering Research, Management and Applications","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Software Engineering Research, Management and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-11265-7_2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}