CMOS power amplifiers

A. Grebennikov, M. Acar
{"title":"CMOS power amplifiers","authors":"A. Grebennikov, M. Acar","doi":"10.1049/pbcs071g_ch7","DOIUrl":null,"url":null,"abstract":"Accurate MOSFET device modeling is an extremely important procedure to develop low-cost silicon integrated circuits using CMOS technology for higher speed and higher frequency integrated circuits and subsystems within shorter design time. The accuracy of MOSFET models to describe their nonlinear behavior is crucial to predict the entire circuit performance. The lumped-parameter equation-based equivalent circuit model provides a clearer physical description and more design flexibility. The cross section of the MOSFET and substrate coupling networks are shown in Figure 7.1(a). Here, the considerable ohmic loss caused by the semiconductive silicon substrate is characterized by the resistances Rb1, Rb2, and Rsub. The junction capacitance corresponding to source-drain region is represented by the capacitances Cjs and Cjd. The capacitance Cgb represents the gate-to-substrate coupling capacitance consisting of the gate oxide capacitance and the depletion layer capacitance.","PeriodicalId":241838,"journal":{"name":"Radio Frequency and Microwave Power Amplifiers. Volume 2: Efficiency and Linearity Enhancement Techniques","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Radio Frequency and Microwave Power Amplifiers. Volume 2: Efficiency and Linearity Enhancement Techniques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/pbcs071g_ch7","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Accurate MOSFET device modeling is an extremely important procedure to develop low-cost silicon integrated circuits using CMOS technology for higher speed and higher frequency integrated circuits and subsystems within shorter design time. The accuracy of MOSFET models to describe their nonlinear behavior is crucial to predict the entire circuit performance. The lumped-parameter equation-based equivalent circuit model provides a clearer physical description and more design flexibility. The cross section of the MOSFET and substrate coupling networks are shown in Figure 7.1(a). Here, the considerable ohmic loss caused by the semiconductive silicon substrate is characterized by the resistances Rb1, Rb2, and Rsub. The junction capacitance corresponding to source-drain region is represented by the capacitances Cjs and Cjd. The capacitance Cgb represents the gate-to-substrate coupling capacitance consisting of the gate oxide capacitance and the depletion layer capacitance.
CMOS功率放大器
精确的MOSFET器件建模是利用CMOS技术开发低成本硅集成电路的一个极其重要的过程,可以在更短的设计时间内实现更高速度和更高频率的集成电路和子系统。描述MOSFET非线性行为的模型的准确性对于预测整个电路的性能至关重要。基于集总参数方程的等效电路模型提供了更清晰的物理描述和更大的设计灵活性。MOSFET和衬底耦合网络的截面如图7.1(a)所示。在这里,由半导体硅衬底引起的相当大的欧姆损耗由电阻Rb1, Rb2和Rsub表征。源漏区对应的结电容由电容Cjs和Cjd表示。电容Cgb表示栅极-衬底耦合电容,由栅极氧化物电容和耗尽层电容组成。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信